FEATURE
WITec Suite7
has been released
WITec alpha300
semiconductor edition
WITec Product Line
ALPHA300 SERIES
The Raman Technique
The Raman effect is based on light interacting with the chemical bonds of a sample. Due to vibrations in the chemical bonds the interaction with photons causes specific energy shifts in the back scattered light that appear in a Raman spectrum. The Raman spectrum is unique for each chemical composition and can provide qualitative and quantitative information of the material.
Raman spectroscopy
can be used for imaging ,provides a chemical “fingerprint” of the investigated compounds, is non-invasive, non-destructive, requires minimal, if any, sample preparation and is insensitive to water
Confocal Raman Imaging
The WITec Raman microscopes and imaging systems combine an extremely sensitive confocal microscope with an ultra-high throughput spectroscopy system for unprecedented chemical sensitivity. Their outstanding performance in speed, sensitivity and resolution can be jointly applied without compromises.
3D Imaging and Depth Profiles
3D volume scans and depth profiles are valuable tools in providing information about the dimensions of objects or the distribution of a certain compound throughout the sample.
WITec’s confocal microscope systems provide depth resolution and a strongly reduced background signal and facilitate the generation of depth profiles and 3D images with exceptional spectral and spatial resolution. Images are recorded point by point and line by line, while scanning the sample through the excitation focus. With this technique, the specimen can be analyzed in segments along the optical axis and depth profiles or 3D images can be generated.
Correlative techniques
RAMAN + AFM
By combining confocal Raman imaging with AFM, the chemical properties of the sample can be easily linked with the surface structure. These two complementary techniques are available in correlative Raman-AFM WITec microscopes for flexible and comprehensive sample characterization.
RAMAN + SNOM
Combining Raman characterization with SNOM for optical imaging beyond the diffraction limit provides informative results for even challenging experimental requirement.
RAMAN + SEM
The Raman-SEM (RISE) combination is a relatively new correlative microscopy technique. Structures in the nm-range detected by SEM can now be correlated to chemical Raman imaging from the same sample area.
