PRODUCT RANGE
Desktop Scanning Electron Microscope ZEM Series
ZEM Ultra Field Emission Desktop-SEM
ZEM20 Desktop-SEM
ZEM18 Desktop-SEM
ZEM15C Desktop-SEM
In-Situ SEM Measurement System Series
SEM Nano-Probe Station
SEM Nanomechanical Stage
The Stretching Stage
In-Situ SEM MEMS Atmosphere Stage
In-Situ TEM Measurement System Series
In-Situ
Electrical Measurement System
In-Situ Optical Measurement System
In-Situ Heating Measurement System
In-Situ Atmosphere Heating Measurement System
In-Situ Liquid Measurement System
In-Situ Mechanics Measurement System
Scanning Tunneling Microscope (STM) Series
LT-STM
Mini-ATM
TERS
Stylus Profiler JS Series
JS10B Stylus Profiler
JS100B Stylus Profiler
JS2000B Stylus Profiler
Lithography Machine Series
Electron Beam Lithography Machine
DMD Maskless Lithography Machine
Nano Displacement Stage Series
MF Single-axis Displacement Stage
RF Rotary Stage
ML Single-axis Displacement Stage
NF Micro-Positioning Stage
XYMF Dual-axis Displacement Stage
Single Module of The Three-axis Probe Station
Z-axis Elevation Stage
Piezoelectric Tilt Stage
Chemical Vapor Deposition Systems (CVD) Series
CVD
PECVD
Two-Dimensional Material Transfer Stage
Probe Stages Series
Dry Liquid Helium Temperature Zone Probe Station
Cryogenic Liquid Nitrogen Probe Station
Liquid Helium Cryostat
