Since the establishment of the company in 1990, our primary focus has been on researching new methods and developing instruments for materials science and engineering. This effort is driven by our in-house R&D team in collaboration with academic partners from select universities and research institutions.
Technoorg Linda is fully committed to serving the global scientific community with the highest-quality sample preparation tools designed for electron microscopy analysis. Our customers include industrial, governmental, and academic research departments and laboratories, covering the full spectrum of materials science instrumentation users. Recognized as a trusted name within the global scientific community, Technoorg Linda is synonymous with precision instruments and world-leading sample preparation techniques.
SEMPRE P SMAR T is an award-winning ion milling solution designed for high-precision SEM and EB SD sample preparation. The device is equipped with a high-energy and, optionally, a low-energy argon ion source. Ion polishing allows for the improvement and cleaning of mechanically polished SEM samples and the preparation of damage- free surfaces for EBSD analysis . Outstanding cross- sectional results and precision are achieved even in demanding and sensitive cases , such as semiconductor testing and investigation o f Li – ion battery separator membranes.
KEY FEATURES OF SEMPREP SMART
- AI-assisted, easy-to-use operation
- Highly automated workflow
- Extreme-precision cross-sectioning
- Intuitive control software
- Wide range of sample dimensions
- High-energy ion source for rapid milling
- Optional low-energy ion source for ultimate polishing results
- Vacuum sample transfer capability
- Automated liquid nitrogen or easy-to-use Peltier sample cooling
- Widest energy range on the market
POLISHING WITH AR-ION BEAM
surface of an LED electrode
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A r-ion polishing.
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after mechanical polishing.
after Ar-ion polishing.
the Al plate after Ar-ion polishing.
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90° CROSS-SECTIONAL CUT AND 30° SLOPE CUT
Cross-sectional cutting for accurate measurements and real cross-section investigations. 30° slope cutting for EBSD-quality surfaces anywhere inside the sample.
The accuracy of the cutting
position is ±1 μm.
surface behind the spot.
carbide (WC-Co) sample.
multilayer battery separator
membrane, prepared at room
temperature.
laminated paper with liquid
nitrogen cooling.
SPECIFICATIONS
Ion sources
- High-energy ion source operating up to 16 keV
- Maximum milling rate: >500 μm/h
- Optional low-energy source
Sample size
Slope cutting (30°) and cross-sectional cutting (90°)
sample holders:
- 30° holder: max. 35 mm (l) x 16 mm (w) x 4.5 mm (th)
- 90° holder: max. 18.6 mm (l) x 16 mm (w) x 6 mm (th)
Sample holder for surface polishing (EBSD) with three
different head types:
- Flat head type: max. Ø50 mm x 4 mm
- Standard type: max. Ø32 mm x 15 mm
- Hollow type : max. Ø25 mm x 23 mm
Sample stage
- Tilting: +/- 30°
- Rotation: 360°
- Oscillation: +/- 1° to +/- 360°
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Sample cooling (optional)
LN2 cooling or Peltier cooling
Vacuum system
Oil-free diaphragm and turbomolecular pumps
Gas supply system
99.999% purity argon working gas, flow controlled
with a needle valve, optional dry nitrogen venting
Turbomolecular pump
Pfeiffer HiPace 80 Neo
Imaging system
High-resolution CMOS camera with magnification-
tracing measurement capabilities within the live image
Computer control
Easy-to-use graphical interface with ergonomic,
built-in multi-touch screen, automated ion source
operation, and stage position calibration
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